Description

The Dresden Fraunhofer Cluster Nanoanalysis (DFCNA) organizes in cooperation with the INSTN/CEA-Grenoble the one-week advanced training course: alienS - school for advanced materials characterization. On five days, supplementary lectures from both research centers will be offered with a comprehensive overview of techniques for material characterization. Supported by Cool Silicon, the event offers a unique look at the characterization landscape in Europe, with a special focus on energy, health and information technology. In Grenoble and Dresden the training group is limited to a maximum of 12 persons.

Internationally acknowledged European research centers will host complementary lectures for 5 days providing a comprehensive overview of techniques for material characterization. The school, supported by Cool Silicon, will offer a unique view of the characterization landscape in Europe, with particular attention to the energy, health and information technology application fields.

Audience targeted by the school Professionals, engineers, researchers from industry, facing material characterization issues

Entry requirements No specific requirements

Competences covered

  • Acquire a general overview of nanoscale characterization techniques and related roadmap
  • Focus on methodology for the study of surfaces, interfaces, nanomaterials and nanostructures
  • Describe the potential and limitations of the various techniques
  • Practicals based on the general overview and on the topics focus through case studies

Main outcomes of the school Theoretical lectures will be paired to practical works on real case studies that will highlight the capabilities and complementarities of the characterization techniques. The lectures will be given and broadcast from two sites renowned for their characterization expertise and their start-of-the-art facilities.

The course covers:

3 general characterization topics: - Chemical and morphological properties - Electrical and morphological properties - Structural and morphological properties

3 methodology axes: - Surface analysis - 3D Characterization - Characterization by Large Scale Facilities

Registration deadline: Feb 15th, 2019

Registration form

Cluster organisation
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